A Metrohm XDS Process Analyzer was set up and connected to a fiber optic probe with a specially designed tip installed into a Bohle VMA 70 single-pot high-shear granulator.
Application Note “Monitoring a single-pot granulator using near-infrared spectroscopy”
Our Application Note “Monitoring a single-pot granulator using near-infrared spectroscopy” shows the capability of a novel probe design equipped with a NIRS XDS Process Analyzer for predicting the residual amounts of solvent during the drying phase in a high-shear granulator. This system configuration can reduce the powder sample density variance such that moisture and solvent levels can be accurately modelled and predicted in process.
The NIRS XDS Process Analyzer provides the next generation of process analysers for real-time analysis in the pharmaceutical and chemical industries. Non-destructive, accurate measurements are performed directly in the process line, granulator, dryer or reaction vessel.